Applications / Semiconductor
Solutions for Semiconductor, Metrology, and In-Situ Diagnostics

We offer Avantes integrated spectroscopy solutions for thin film metrology , plasma diagnostics, and process monitoring applications where in-situ or in-vacuodiagnostic capabilities are required. Avantes fiber optic based spectrometers have a proven track record with metrology and process applications. with > 6000 installed units and 14 years experience. Avantes spectroscopy solutions have exceptional capability at very affordable prices. New turn-key Raman spectroscopy systems are now available.

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